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Type: 
Journal
Description: 
We have studied the electrical activation of the Fe2+∕3+ trap in Fe-implanted InP by means of capacitance-voltage and deep level transient spectroscopy analyses. Five deep traps have been identified and we have characterized the concentration and depth distribution of the Fe2+∕3+ deep trap, located at EC–0.66eV. The InP substrate background doping, i.e., the Fermi-level position, plays a crucial role in the Fe activation process by setting an upper limit to the amount of Fe centers electrically activated as deep acceptor traps.
Publisher: 
AIP
Publication date: 
19 Dec 2005
Authors: 

B Fraboni, A Gasparotto, T Cesca, A Verna, G Impellizzeri, F Priolo

Biblio References: 
Volume: 87 Issue: 25 Pages: 252113
Origin: 
Applied Physics Letters